COINSE

Shin Yoo

Tenured Associate Professor
School of Computing
Korea Advanced Institute of Science and Technology
291 Daehak Ro, Yuseong Gu
Daejeon 34141
Republic of Korea

shin.yoo@kaist.ac.kr
+82 42 350 3567

Curriculum Vitae

Education and Employment

Publication

Below are some of the recent publications. Please see my Google Scholar profile for more detail.

Peer-reviewed Journals

  1. Deceiving Humans and Machines Alike: Search-Based Test Input Generation for DNNs Using Variational Autoencoders, Kang, S., Feldt, R. and Yoo, S., ACM Transactions on Software Engineering Methodologies, 33(4):103:1–24. [pdf] [bibtex] 
      @article{Kang2024ac,
  author = {Kang, Sungmin and Feldt, Robert and Yoo, Shin},
  doi = {10.1145/3635706},
  issue = {4},
  journal = {ACM Transactions on Software Engineering Methodologies},
  month = dec,
  pages = {103:1--24},
  title = {Deceiving Humans and Machines Alike: Search-Based Test Input Generation for DNNs Using Variational Autoencoders},
  volume = {33},
  year = {2024},
  bdsk-url-1 = {https://doi.org/10.1145/3635706}
}
  2. A Quantitative and Qualitative Evaluation of LLM-based Explainable Fault Localization, Kang, S., An, G. and Yoo, S., Proceedings of the ACM on Software Engineering, 1(FSE):1424–1446. [pdf] [bibtex] 
      @article{Kang2024ay,
  author = {Kang, Sungmin and An, Gabin and Yoo, Shin},
  issue = {FSE},
  journal = {Proceedings of the ACM on Software Engineering},
  month = jul,
  number = {FSE},
  pages = {1424-1446},
  title = {A Quantitative and Qualitative Evaluation of LLM-based Explainable Fault Localization},
  volume = {1},
  year = {2024}
}
  3. Explainable Automated Debugging via Large Language Model-driven Scientific Debugging, Kang, S., Chen, B., Yoo, S. and Lou, J.-G., Journal of Empirical Software Engineering, (to appear): [pdf] [bibtex] 
      @article{Kang2024sn,
  author = {Kang, Sungmin and Chen, Bei and Yoo, Shin and Lou, Jian-Guang},
  journal = {Journal of Empirical Software Engineering},
  number = {to appear},
  title = {Explainable Automated Debugging via Large Language Model-driven Scientific Debugging},
  year = {2024}
}
  4. Causal Program Dependence Analysis, Lee, S., Binkley, D., Feldt, R., Gold, N. and Yoo, S., Science of Computer Programming, 103208. [pdf] [bibtex] 
      @article{Lee2024ab,
  author = {Lee, Seongmin and Binkley, Dave and Feldt, Robert and Gold, Nicolas and Yoo, Shin},
  journal = {Science of Computer Programming},
  pages = {103208},
  title = {Causal Program Dependence Analysis},
  year = {2024}
}
  5. Evaluating Diverse Large Language Models for Automatic and General Bug Reproduction, Kang, S., Yoon, J., Askarbekkyzy, N. and Yoo, S., IEEE Transactions on Software Engineering, 50(10):2677–2694. [pdf] [bibtex] 
      @article{Kang2024aa,
  author = {Kang, Sungmin and Yoon, Juyeon and Askarbekkyzy, Nargiz and Yoo, Shin},
  date-added = {2024-08-26 06:59:51 +0900},
  date-modified = {2024-08-26 07:01:15 +0900},
  journal = {IEEE Transactions on Software Engineering},
  pages = {2677-2694},
  volume = {50},
  number = {10},
  title = {Evaluating Diverse Large Language Models for Automatic and General Bug Reproduction},
  year = {2024}
}
  6. Learning Test-Mutant Relationship for Accurate Fault Localisation, Kim, J., An, G., Feldt, R. and Yoo, S., Information and Software Technology, 162:107272. [pdf] [bibtex] 
      @article{Kim2023qa1,
  author = {Kim, Jinhan and An, Gabin and Feldt, Robert and Yoo, Shin},
  journal = {Information and Software Technology},
  keywords = {journal},
  link = {https://www.sciencedirect.com/journal/information-and-software-technology},
  month = jun,
  pages = {107272},
  series = {IST},
  title = {Learning Test-Mutant Relationship for Accurate Fault Localisation},
  volume = {162},
  year = {2023}
}
  7. Evaluating Surprise Adequacy for Deep Learning System Testing, Kim, J., Feldt, R. and Yoo, S., ACM Transactions on Software Engineering and Methodology, 32(2):42:1–29. [pdf] [bibtex] 
      @article{Kim2022hg,
  address = {New York, NY, USA},
  author = {Kim, Jinhan and Feldt, Robert and Yoo, Shin},
  journal = {ACM Transactions on Software Engineering and Methodology},
  month = jun,
  pages = {42:1--29},
  publisher = {Association for Computing Machinery},
  series = {TOSEM},
  title = {Evaluating Surprise Adequacy for Deep Learning System Testing},
  volume = {32(2)},
  year = {2023}
}
  8. Arachne: Search Based Repair of Deep Neural Networks, Sohn, J., Kang, S. and Yoo, S., ACM Transactions on Software Engineering Methodology, 32(4):85:1–26. [pdf] [bibtex] 
      @article{Sohn2022cr,
  author = {Sohn, Jeongju and Kang, Sungmin and Yoo, Shin},
  date-modified = {2023-05-29 12:26:00 +0900},
  journal = {{ACM} {T}ransactions on {S}oftware {E}ngineering {M}ethodology},
  number = {4},
  pages = {85:1--26},
  title = {Arachne: Search Based Repair of Deep Neural Networks},
  volume = {32},
  year = {2023}
}
  9. Predictive Mutation Analysis via Natural Language Channel in Source Code, Kim, J., Jeon, J., Hong, S. and Yoo, S., ACM Transactions on Software Engineering and Methodology, 31(4):1–27. [pdf] [bibtex] 
      @article{Kim2022xy,
  author = {Kim, Jinhan and Jeon, Juyoung and Hong, Shin and Yoo, Shin},
  journal = {ACM Transactions on Software Engineering and Methodology},
  number = {4},
  pages = {1--27},
  title = {Predictive Mutation Analysis via Natural Language Channel in Source Code},
  volume = {31},
  year = {2022}
}
  10. Observation-based approximate dependency modeling and its use for program slicing, Lee, S., Binkley, D., Feldt, R., Gold, N. and Yoo, S., Journal of Systems and Software, 179:110988. [pdf] [bibtex] 
      @article{Lee2021ua,
  author = {Lee, Seongmin and Binkley, David and Feldt, Robert and Gold, Nicolas and Yoo, Shin},
  journal = {Journal of Systems and Software},
  pages = {110988},
  title = {Observation-based approximate dependency modeling and its use for program slicing},
  volume = {179},
  year = {2021}
}
  11. Empirical Evaluation of Fault Localisation Using Code and Change Metrics, Sohn, J. and Yoo, S., IEEE Transactions on Software Engineering, 47(8):1605–1625. [pdf] [bibtex] 
      @article{Sohn2019jk,
  author = {Sohn, Jeongju and Yoo, Shin},
  doi = {10.1109/TSE.2019.2930977},
  issn = {0098-5589},
  journal = {IEEE Transactions on Software Engineering},
  number = {8},
  pages = {1605--1625},
  title = {Empirical Evaluation of Fault Localisation Using Code and Change Metrics},
  volume = {47},
  year = {2021},
  bdsk-url-1 = {https://doi.org/10.1109/TSE.2019.2930977}
}
  12. Mining Fix Patterns for FindBugs Violations, Liu, K., Kim, D., Bissyande, T.F., Yoo, S. and Traon, Y.L., IEEE Transactions on Software Engineering, 47(1):165–188. [bibtex] 
      @article{Liu2018aa,
  author = {Liu, K. and Kim, D. and Bissyande, T. F. and Yoo, S. and Traon, Y. Le},
  issn = {0098-5589},
  journal = {IEEE Transactions on Software Engineering},
  number = {1},
  pages = {165--188},
  title = {Mining Fix Patterns for {F}ind{B}ugs Violations},
  volume = {47},
  year = {2021}
}

Peer-reviewed Conferences

  1. Iterative Refactoring of Real-World Open-Source Programs with Large Language Models, Choi, J., An, G. and Yoo, S. Proceedings of the 16th International Symposium on Search-Based Software Engineering. Springer Nature. 49–55. [pdf] [bibtex] 
      @incollection{Choi2024aa,
  author = {Choi, Jinsu and An, Gabin and Yoo, Shin},
  booktitle = {Proceedings of the 16th International Symposium on Search-Based Software Engineering},
  month = jul,
  pages = {49--55},
  publisher = {Springer Nature},
  series = {Lecture Notes in Computer Science},
  title = {Iterative Refactoring of Real-World Open-Source Programs with Large Language Models},
  volume = {14767},
  year = {2024}
}
  2. The GitHub Recent Bugs Dataset for Evaluating LLM-Based Debugging Applications, Lee, J., Kang, S., Yoon, J. and Yoo, S., Proceedings of the IEEE Conference on Software Testing, Verification and Validation - Tools and Demonstratin Track, 442–444. [pdf] [bibtex] 
      @inproceedings{Lee2024aa,
  author = {Lee, Jaeyong and Kang, Sungmin and Yoon, Juyeon and Yoo, Shin},
  booktitle = {Proceedings of the IEEE Conference on Software Testing, Verification and Validation - Tools and Demonstratin Track},
  doi = {10.1109/ICST60714.2024.00049},
  issn = {2159-4848},
  pages = {442-444},
  series = {ICST 2024},
  title = {The GitHub Recent Bugs Dataset for Evaluating LLM-Based Debugging Applications},
  year = {2024}
}
  3. Just-in-Time Flaky Test Detection via Abstracted Failure Symptom Matching, An, G., Yoon, J., Bach, T., Hong, J. and Yoo, S., Proceedings of the 40th International Conference on Software Maintenance and Evolution. [pdf] [bibtex] 
      @inproceedings{An2024wm,
  author = {An, Gabin and Yoon, Juyeon and Bach, Thomas and Hong, Jingun and Yoo, Shin},
  booktitle = {Proceedings of the 40th International Conference on Software Maintenance and Evolution},
  date-added = {2024-08-27 10:55:20 +0900},
  date-modified = {2024-08-27 10:58:03 +0900},
  series = {ICSME 2024 Industry Track},
  title = {Just-in-Time Flaky Test Detection via Abstracted Failure Symptom Matching},
  year = {2024}
}
  4. Intent-Driven Mobile GUI Testing with Autonomous Large Language Model Agents, Yoon, J., Feldt, R. and Yoo, S., Proceedings of the 16th IEEE International Conference on Software Testing, Verification and Validation, 129–139. [pdf] [bibtex] 
      @inproceedings{Yoon2024aa,
  author = {Yoon, Juyeon and Feldt, Robert and Yoo, Shin},
  booktitle = {Proceedings of the 16th IEEE International Conference on Software Testing, Verification and Validation},
  doi = {10.1109/ICST60714.2024.00020},
  pages = {129--139},
  series = {ICST 2024},
  title = {Intent-Driven Mobile GUI Testing with Autonomous Large Language Model Agents},
  year = {2024},
  bdsk-url-1 = {https://doi.org/10.1109/ICST60714.2024.00020}
}
  5. Large Language Models for Software Engineering: Survey and Open Problems, Fan, A., Gokkaya, B., Harman, M., Lyubarskiy, M., Sengupta, S., Yoo, S. and Zhang, J.M., Proceedings of the 45th IEEE/ACM International Conference on Software Engineering: Future of Software Engineering, 31–53. [pdf] [bibtex] 
      @inproceedings{Fan2023yu,
  author = {Fan, A. and Gokkaya, B. and Harman, M. and Lyubarskiy, M. and Sengupta, S. and Yoo, S. and Zhang, J. M.},
  booktitle = {Proceedings of the 45th IEEE/ACM International Conference on Software Engineering: Future of Software Engineering},
  month = may,
  pages = {31-53},
  publisher = {IEEE Computer Society},
  series = {ICSE-FoSE},
  title = {Large Language Models for Software Engineering: Survey and Open Problems},
  year = {2023}
}
  6. The Inversive Relationship Between Bugs and Patches: An Empirical Study, Kim, J., Park, J. and Yoo, S., Proceedings of the 18th International Workshop on Mutation Analysis, 314–323. [pdf] [bibtex] 
      @inproceedings{Kim2023pa,
  author = {Kim, Jinhan and Park, Jongchan and Yoo, Shin},
  booktitle = {Proceedings of the 18th International Workshop on Mutation Analysis},
  date-modified = {2023-08-10 15:22:10 +0900},
  month = apr,
  pages = {314--323},
  series = {MUTATION 2023},
  title = {The Inversive Relationship Between Bugs and Patches: An Empirical Study},
  year = {2023},
  bdsk-file-1 = {YnBsaXN0MDDSAQIDBFxyZWxhdGl2ZVBhdGhYYm9va21hcmtfED4uLi8uLi8uLi8uLi9MaWJyYXJ5L0Nsb3VkU3RvcmFnZS9Ecm9wYm94L1BhcGVycy9LaW0yMDIzcGFhLnBkZk8RBGRib29rZAQAAAAABBAwAAAAAAAAAAAAAAAAAAAAAAAAAAAAAAAAAAAAAAAAAAAAAABUAwAABQAAAAEBAABVc2VycwAAAAcAAAABAQAAbnRyb2xscwAHAAAAAQEAAExpYnJhcnkADAAAAAEBAABDbG91ZFN0b3JhZ2UHAAAAAQEAAERyb3Bib3gABgAAAAEBAABQYXBlcnMAAA4AAAABAQAAS2ltMjAyM3BhYS5wZGYAABwAAAABBgAABAAAABQAAAAkAAAANAAAAEgAAABYAAAAaAAAAAgAAAAEAwAAI2YAAAAAAAAIAAAABAMAAE+tAAAAAAAACAAAAAQDAABWrQAAAAAAAAgAAAAEAwAA5oPZAAAAAAAIAAAABAMAALhADgAAAAAACAAAAAQDAABLRA4AAAAAAAgAAAAEAwAAZuNxAQAAAAAcAAAAAQYAAKQAAAC0AAAAxAAAANQAAADkAAAA9AAAAAQBAAAIAAAAAAQAAEHFQlsEgAAAGAAAAAECAAABAAAAAAAAAA8AAAAAAAAAAAAAAAAAAAAIAAAABAMAAAUAAAAAAAAABAAAAAMDAAD1AQAACAAAAAEJAABmaWxlOi8vLwwAAAABAQAATWFjaW50b3NoIEhECAAAAAQDAAAAkIKW5wAAAAgAAAAABAAAQcX1BKwAAAAkAAAAAQEAAEIzQjlCMzYxLUZCQUItNERERS1CNDMxLUQ4QTNBQUYxMUEyQhgAAAABAgAAgQAAAAEAAADvEwAAAQAAAAAAAAAAAAAAAQAAAAEBAAAvAAAAAAAAAAEFAAAaAAAAAQEAAE5TVVJMRG9jdW1lbnRJZGVudGlmaWVyS2V5AAAEAAAAAwMAACePBADzAAAAAQIAADMyOGRiNmE4MjA1MWQzZjZkN2UwMGUwMzgxOWZjZTViYmRjNzFkNWQzODdlZGQ5YTdkMDE0YzlkOWNmYjJmYjk7MDA7MDAwMDAwMDA7MDAwMDAwMDA7MDAwMDAwMDA7MDAwMDAwMDAwMDAwMDAyMDtjb20uYXBwbGUuYXBwLXNhbmRib3gucmVhZC13cml0ZTswMTswMTAwMDAwZDswMDAwMDAwMDAxNzFlMzY2OzY2Oy91c2Vycy9udHJvbGxzL2xpYnJhcnkvY2xvdWRzdG9yYWdlL2Ryb3Bib3gvcGFwZXJzL2tpbTIwMjNwYWEucGRmAADYAAAA/v///wEAAAAAAAAAEQAAAAQQAACAAAAAAAAAAAUQAAAUAQAAAAAAABAQAABIAQAAAAAAAEAQAAA4AQAAAAAAAAIgAAAUAgAAAAAAAAUgAACEAQAAAAAAABAgAACUAQAAAAAAABEgAADIAQAAAAAAABIgAACoAQAAAAAAABMgAAC4AQAAAAAAACAgAAD0AQAAAAAAADAgAAAgAgAAAAAAAAHAAABoAQAAAAAAABHAAAAUAAAAAAAAABLAAAB4AQAAAAAAAIDwAABYAgAAAAAAACgCAIBMAgAAAAAAAAAIAA0AGgAjAGQAAAAAAAACAQAAAAAAAAAFAAAAAAAAAAAAAAAAAAAEzA==}
}
  7. Towards Autonomous Testing Agents via Conversational Large Language Models, Feldt, R., Kang, S., Yoon, J. and Yoo, S., Proceedings of the 38th IEEE/ACM International Conference on Automated Software Engineering (ASE), 1688–1693. [pdf] [bibtex] 
      @inproceedings{Feldt2023ax,
  author = {Feldt, Robert and Kang, Sungmin and Yoon, Juyeon and Yoo, Shin},
  booktitle = {Proceedings of the 38th IEEE/ACM International Conference on Automated Software Engineering (ASE)},
  date-added = {2023-11-28 17:39:51 +0900},
  date-modified = {2023-11-28 17:39:51 +0900},
  doi = {10.1109/ASE56229.2023.00148},
  pages = {1688-1693},
  series = {ASE 2023},
  title = {Towards Autonomous Testing Agents via Conversational Large Language Models},
  year = {2023},
  bdsk-url-1 = {https://doi.org/10.1109/ASE56229.2023.00148}
}
  8. BUGSC++: A Highly Usable Real World Defect Benchmark for C/C++, An, G., Kwon, M., Choi, K., Yi, J. and Yoo, S., Proceedings of the 38th IEEE/ACM International Conference on Automated Software Engineering, 2034–2037. [pdf] [bibtex] 
      @inproceedings{An2023ab,
  author = {An, Gabin and Kwon, Minhyuk and Choi, Kyunghwa and Yi, Jooyong and Yoo, Shin},
  booktitle = {Proceedings of the 38th IEEE/ACM International Conference on Automated Software Engineering},
  doi = {10.1109/ASE56229.2023.00208},
  pages = {2034-2037},
  series = {ASE 2023},
  title = {BUGSC++: A Highly Usable Real World Defect Benchmark for C/C++},
  year = {2023},
  bdsk-url-1 = {https://doi.org/10.1109/ASE56229.2023.00208}
}
  9. A Bayesian Framework for Automated Debugging, Kang, S., Choi, W. and Yoo, S., Proceedings of the 32nd International Symposium on Software Testing and Analysis, 880–891. [pdf] [bibtex] 
      @inproceedings{Kang2023bb,
  author = {Kang, Sungmin and Choi, Wonkeun and Yoo, Shin},
  booktitle = {Proceedings of the 32nd International Symposium on Software Testing and Analysis},
  date-modified = {2023-08-10 15:20:03 +0900},
  pages = {880--891},
  series = {ISSTA 2023},
  title = {A Bayesian Framework for Automated Debugging},
  year = {2023},
  bdsk-file-1 = {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}
}
  10. Towards Objective-Tailored Genetic Improvement Through Large Language Models, Kang, S. and Yoo, S., Proceedings of the 12th International Workshop on Genetic Improvement, 19–20. [pdf] [bibtex] 
      @inproceedings{Kang2023lg,
  author = {Kang, Sungmin and Yoo, Shin},
  booktitle = {Proceedings of the 12th International Workshop on Genetic Improvement},
  date-modified = {2023-08-10 15:19:13 +0900},
  pages = {19--20},
  series = {GI 2023},
  title = {Towards Objective-Tailored Genetic Improvement Through Large Language Models},
  year = {2023},
  bdsk-file-1 = {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}
}
  11. Repairing DNN Architecture: Are We There Yet?, Kim, J., Humbatova, N., Jahangirova, G., Tonella, P. and Yoo, S., Proceedings of the 16th IEEE International Conference on Software Testing, Verification and Validation, 234–245. [pdf] [bibtex] 
      @inproceedings{Kim2023aa,
  author = {Kim, Jinhan and Humbatova, Nargiz and Jahangirova, Gunel and Tonella, Paolo and Yoo, Shin},
  booktitle = {Proceedings of the 16th IEEE International Conference on Software Testing, Verification and Validation},
  date-modified = {2023-08-10 15:21:16 +0900},
  pages = {234--245},
  series = {ICST 2023},
  title = {Repairing DNN Architecture: Are We There Yet?},
  year = {2023},
  bdsk-file-1 = {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}
}
  12. Large Language Models are Few-shot Testers: Exploring LLM-based General Bug Reproduction, Kang, S., Yoon, J. and Yoo, S., Proceedings of the 45th IEEE/ACM International Conference on Software Engineering, 2312–2323. [pdf] [bibtex] 
      @inproceedings{Kang2023aa,
  author = {Kang, Sungmin and Yoon, Juyeon and Yoo, Shin},
  booktitle = {Proceedings of the 45th IEEE/ACM International Conference on Software Engineering},
  pages = {2312 -- 2323},
  series = {ICSE 2023},
  title = {Large Language Models are Few-shot Testers: Exploring LLM-based General Bug Reproduction},
  year = {2023}
}
  13. Fonte: Finding Bug Inducing Commits from Failures, An, G., Hong, J., Kim, N. and Yoo, S., Proceedings of the 45th IEEE/ACM International Conference on Software Engineering, 589–601. [pdf] [bibtex] 
      @inproceedings{An2023aa,
  author = {An, Gabin and Hong, Jingun and Kim, Naryeong and Yoo, Shin},
  booktitle = {Proceedings of the 45th IEEE/ACM International Conference on Software Engineering},
  pages = {589 -- 601},
  series = {ICSE 2023},
  title = {Fonte: Finding Bug Inducing Commits from Failures},
  year = {2023}
}
  14. Augmenting Equivalent Mutant Dataset Using Symbolic Execution, Chung, S. and Yoo, S., Proceedings of the 2022 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW), 150–159. [pdf] [bibtex] 
      @inproceedings{Chung2022uz,
  author = {Chung, Seungjun and Yoo, Shin},
  booktitle = {Proceedings of the 2022 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)},
  doi = {10.1109/ICSTW55395.2022.00038},
  issn = {2159-4848},
  month = apr,
  pages = {150-159},
  publisher = {IEEE Computer Society},
  title = {Augmenting Equivalent Mutant Dataset Using Symbolic Execution},
  url = {https://doi.ieeecomputersociety.org/10.1109/ICSTW55395.2022.00038},
  year = {2022},
  bdsk-url-1 = {https://doi.ieeecomputersociety.org/10.1109/ICSTW55395.2022.00038},
  bdsk-url-2 = {https://doi.org/10.1109/ICSTW55395.2022.00038}
}
  15. Language Models Can Prioritize Patches for Practical Program Patching, Kang, S. and Yoo, S., Proceedings of the 3rd International Workshop on Automated Program Repair, 8–15. [pdf] [bibtex] 
      @inproceedings{Kang2022kl,
  author = {Kang, Sungmin and Yoo, Shin},
  booktitle = {Proceedings of the 3rd International Workshop on Automated Program Repair},
  pages = {8--15},
  series = {APR 2022},
  title = {Language Models Can Prioritize Patches for Practical Program Patching},
  year = {2022}
}
  16. FDG: A Precise Measurement of Fault Diagnosability Gain of Test Cases, An, G. and Yoo, S., Proceedings of the 31st ACM SIGSOFT International Symposium on Software Testing and Analysis, 14–26. [pdf] [bibtex] 
      @inproceedings{An2022pb,
  author = {An, Gabin and Yoo, Shin},
  booktitle = {Proceedings of the 31st ACM SIGSOFT International Symposium on Software Testing and Analysis},
  pages = {14--26},
  series = {ISSTA 2022},
  title = {{FDG}: A Precise Measurement of Fault Diagnosability Gain of Test Cases},
  year = {2022}
}
  17. Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA, An, G., Yoon, J., Sohn, J., Hong, J., Hwang, D. and Yoo, S., Proceedings of the 44th IEEE/ACM International Conference on Software Engineering - Software Engineering In Practice Track, 65–74. [pdf] [bibtex] 
      @inproceedings{An2022qe,
  author = {An, Gabin and Yoon, Juyeon and Sohn, Jeongju and Hong, Jingun and Hwang, Dongwon and Yoo, Shin},
  booktitle = {Proceedings of the 44th IEEE/ACM International Conference on Software Engineering - Software Engineering In Practice Track},
  pages = {65--74},
  series = {ICSE SEIP 2022},
  title = {Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA},
  year = {2022}
}
  18. Repairing Fragile GUI Test Cases Using Word and Layout Embedding, Yoon, J., Chung, S., Shin, K., Kim, J., Hong, S. and Yoo, S., Proceedings of the 15th IEEE International Conference on Software Testing, Verification and Validation, Industry Track, 291–301. [pdf] [bibtex] 
      @inproceedings{Yoon2022fs,
  author = {Yoon, Juyeon and Chung, Seungjoon and Shin, Kihyuck and Kim, Jinhan and Hong, Shin and Yoo, Shin},
  booktitle = {Proceedings of the 15th IEEE International Conference on Software Testing, Verification and Validation, Industry Track},
  pages = {291--301},
  series = {ICST 2022},
  title = {Repairing Fragile GUI Test Cases Using Word and Layout Embedding},
  year = {2022}
}
  19. Selecting Test Inputs for DNNs Using Differential Testing with Subspecialized Model Instances, Ma, Y.-S., Yoo, S. and Kim, T., Proceedings of the 29th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering, 1467–1470. [pdf] [bibtex] 
      @inproceedings{Ma2021aa,
  author = {Ma, Yu-Seung and Yoo, Shin and Kim, Taeho},
  booktitle = {Proceedings of the 29th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering},
  pages = {1467--1470},
  series = {ESEC/FSE 2021},
  title = {Selecting Test Inputs for DNNs Using Differential Testing with Subspecialized Model Instances},
  year = {2021}
}
  20. Enhancing Lexical Representation of Test Coverage for Failure Clustering, Yoon, J. and Yoo, S., Proceedings of the 36th IEEE/ACM International Conference on Automated Software Engineering Workshops (NLP-SEA 2021), 232–238. [pdf] [bibtex] 
      @inproceedings{Yoon2021el,
  author = {Yoon, Juyeon and Yoo, Shin},
  booktitle = {Proceedings of the 36th IEEE/ACM International Conference on Automated Software Engineering Workshops (NLP-SEA 2021)},
  doi = {10.1109/ASEW52652.2021.00052},
  pages = {232--238},
  title = {Enhancing Lexical Representation of Test Coverage for Failure Clustering},
  year = {2021},
  bdsk-url-1 = {https://doi.org/10.1109/ASEW52652.2021.00052}
}
  21. Searching for multi-fault programs in Defects4J, An, G., Yoon, J. and Yoo, S., Proceedings of the 13th International Symposium on Search Based Software Engineering, 136–150. [pdf] [bibtex] 
      @inproceedings{An2021se,
  author = {An, Gabin and Yoon, Juyeon and Yoo, Shin},
  booktitle = {Proceedings of the 13th International Symposium on Search Based Software Engineering},
  pages = {136--150},
  title = {Searching for multi-fault programs in Defects4J},
  year = {2021}
}
  22. Ahead of Time Mutation Based Fault Localisation using Statistical Inference, Kim, J., An, G., Feldt, R. and Yoo, S., Proceedings of the 32nd International Symposium on Software Reliability Engineering, 253–263. [pdf] [bibtex] 
      @inproceedings{Kim2021xv,
  author = {Kim, Jinhan and An, Gabin and Feldt, Robert and Yoo, Shin},
  booktitle = {Proceedings of the 32nd International Symposium on Software Reliability Engineering},
  pages = {253-263},
  series = {ISSRE 2021},
  title = {Ahead of Time Mutation Based Fault Localisation using Statistical Inference},
  year = {2021}
}
  23. Reducing the search space of bug inducing commits using failure coverage, An, G. and Yoo, S., Proceedings of the ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, 1459–1462. [pdf] [bibtex] 
      @inproceedings{An2021qb,
  author = {An, Gabin and Yoo, Shin},
  booktitle = {Proceedings of the ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering},
  pages = {1459--1462},
  series = {ESEC/FSE (Ideas, Visions, and Reflections Track)},
  title = {Reducing the search space of bug inducing commits using failure coverage},
  year = {2021}
}
  24. Preliminary Evaluation of SWAY in Permutation Decision Space via a Novel Euclidean Embedding, Lee, J., Jung, C., Park, Y.H., Lee, D., Yoon, J. and Yoo, S., Proceedings of the 13th International Symposium on Search Based Software Engineering, 26–40. [pdf] [bibtex] 
      @inproceedings{Lee2021oo,
  author = {Lee, Junghyun and Jung, Chani and Park, Yoo Hwa and Lee, Dongmin and Yoon, Juyeon and Yoo, Shin},
  booktitle = {Proceedings of the 13th International Symposium on Search Based Software Engineering},
  pages = {26--40},
  series = {SSBSE 2021},
  title = {Preliminary Evaluation of {SWAY} in Permutation Decision Space via a Novel Euclidean Embedding},
  year = {2021}
}
  25. Effectively Sampling Higher Order Mutants Using Causal Effect, Oh, S., Lee, S. and Yoo, S., Proceedings of the 16th International Workshop on Mutation Analysis, 19–24. [pdf] [bibtex] 
      @inproceedings{Oh2021vt,
  author = {Oh, Saeyoon and Lee, Seongmin and Yoo, Shin},
  booktitle = {Proceedings of the 16th International Workshop on Mutation Analysis},
  pages = {19--24},
  series = {Mutation 2021},
  title = {Effectively Sampling Higher Order Mutants Using Causal Effect},
  year = {2021}
}
  26. Preliminary Evaluation of Path-aware Crossover Operators for Search-Based Test Data Generation for Autonomous Driving, Han, S., Kim, J., Kim, G., Cho, J., Kim, J. and Yoo, S., Proceedings of the 14th International Workshop on Search Based Software Testing, 44–47. [pdf] [bibtex] 
      @inproceedings{Han2021vp,
  author = {Han, Seunghee and Kim, Jaeuk and Kim, Geon and Cho, Jaemin and Kim, Jiin and Yoo, Shin},
  booktitle = {Proceedings of the 14th International Workshop on Search Based Software Testing},
  pages = {44--47},
  series = {SBST 2021},
  title = {Preliminary Evaluation of Path-aware Crossover Operators for Search-Based Test Data Generation for Autonomous Driving},
  year = {2021}
}
  27. Multimodal Surprise Adequacy Analysis of Inputs for Natural Language Processing DNN Models, Kim, S. and Yoo, S., Proceedings of the 2nd ACM/IEEE International Conference on Automated Software Testing, 80–89. [pdf] [bibtex] 
      @inproceedings{Kim2021ct,
  author = {Kim, Seah and Yoo, Shin},
  booktitle = {Proceedings of the 2nd ACM/IEEE International Conference on Automated Software Testing},
  pages = {80--89},
  series = {AST 2021},
  title = {Multimodal Surprise Adequacy Analysis of Inputs for Natural Language Processing DNN Models},
  year = {2021}
}
  28. Assisting Bug Report Assignment Using Automated Fault Localisation: An Industrial Case Study, Sohn, J., An, G., Hong, J., Hwang, D. and Yoo, S., Proceedings of the 14th IEEE International Conference on Software Testing, Verification and Validation, 284–294. [pdf] [bibtex] 
      @inproceedings{Sohn2021ea,
  author = {Sohn, Jeongju and An, Gabin and Hong, Jingun and Hwang, Dongwon and Yoo, Shin},
  booktitle = {Proceedings of the 14th IEEE International Conference on Software Testing, Verification and Validation},
  pages = {284--294},
  title = {Assisting Bug Report Assignment Using Automated Fault Localisation: An Industrial Case Study},
  year = {2021}
}
  29. Leveraging Fault Localisation to Enhance Defect Prediction, Sohn, J., Kamei, Y., McIntosh, S. and Yoo, S., Proceedings of the 28th IEEE International Conference on Software Analysis, Evolution and Reengineering, 284–294. [pdf] [bibtex] 
      @inproceedings{Sohn2021eb,
  author = {Sohn, Jeongju and Kamei, Yasutaka and McIntosh, Shane and Yoo, Shin},
  booktitle = {Proceedings of the 28th IEEE International Conference on Software Analysis, Evolution and Reengineering},
  pages = {284--294},
  series = {SANER 2021},
  title = {Leveraging Fault Localisation to Enhance Defect Prediction},
  year = {2021}
}

Academic Service

Editorial Board

Steering Committee

Conference Organisation

PhD Supervision

As of June 2024, I have been, or current am, the PhD supervisor for six students; five of them, who are listed below, have graduated.