Computational Intelligence for Software Engineering Lab

Latest Publications

1. Learning Test-Mutant Relationship for Accurate Fault Localisation, Kim, J., An, G., Feldt, R. and Yoo, S., Information and Software Technology. [bibtex]

     @article{Kim2023qa1,
     author = {Kim, Jinhan and An, Gabin and Feldt, Robert and Yoo, Shin},
     title = {Learning Test-Mutant Relationship for Accurate Fault Localisation},
     year = {2023},
     month = jun,
     journal = {Information and Software Technology},
     link = {https://www.sciencedirect.com/journal/information-and-software-technology},
     series = {IST},
     keywords = {journal}
   }
   
   

2. Evaluating Surprise Adequacy for Deep Learning System Testing, Kim, J., Feldt, R. and Yoo, S., ACM Transactions on Software Engineering and Methodology, 32(2):42:1–29. [bibtex]

     @article{Kim2022hg,
     address = {New York, NY, USA},
     author = {Kim, Jinhan and Feldt, Robert and Yoo, Shin},
     journal = {ACM Transactions on Software Engineering and Methodology},
     month = jun,
     pages = {42:1--29},
     publisher = {Association for Computing Machinery},
     series = {TOSEM},
     title = {Evaluating Surprise Adequacy for Deep Learning System Testing},
     volume = {32(2)},
     year = {2023}
   }
   
   

3. The Inversive Relationship Between Bugs and Patches: An Empirical Study, Kim, J., Park, J. and Yoo, S., Proceedings of the 18th International Workshop on Mutation Analysis. [bibtex]

     @inproceedings{Kim2023pa,
     author = {Kim, Jinhan and Park, Jongchan and Yoo, Shin},
     booktitle = {Proceedings of the 18th International Workshop on Mutation Analysis},
     month = apr,
     series = {MUTATION 2023},
     title = {The Inversive Relationship Between Bugs and Patches: An Empirical Study},
     year = {2023}
   }
   
   

4. A Bayesian Framework for Automated Debugging, Kang, S., Choi, W. and Yoo, S., Proceedings of the 32nd International Symposium on Software Testing and Analysis. [bibtex]

     @inproceedings{Kang2023bb,
     author = {Kang, Sungmin and Choi, Wonkeun and Yoo, Shin},
     booktitle = {Proceedings of the 32nd International Symposium on Software Testing and Analysis},
     series = {ISSTA 2023},
     title = {A Bayesian Framework for Automated Debugging},
     year = {2023}
   }
   
   

5. Towards Objective-Tailored Genetic Improvement Through Large Language Models, Kang, S. and Yoo, S., Proceedings of the 12th International Workshop on Genetic Improvement. [bibtex]

     @inproceedings{Kang2023lg,
     author = {Kang, Sungmin and Yoo, Shin},
     booktitle = {Proceedings of the 12th International Workshop on Genetic Improvement},
     series = {GI 2023},
     title = {Towards Objective-Tailored Genetic Improvement Through Large Language Models},
     year = {2023}
   }
   
   

6. Arachne: Search Based Repair of Deep Neural Networks, Sohn, J., Kang, S. and Yoo, S., ACM Transactions on Software Engineering Methodology, 32(4):1–26. [pdf] [bibtex]

     @article{Sohn2022cr,
     author = {Sohn, Jeongju and Kang, Sungmin and Yoo, Shin},
     date-modified = {2023-05-29 12:26:00 +0900},
     journal = {{ACM} {T}ransactions on {S}oftware {E}ngineering {M}ethodology},
     number = {4},
     pages = {1--26},
     title = {Arachne: Search Based Repair of Deep Neural Networks},
     volume = {32},
     year = {2023}
   }
   
   

7. Repairing DNN Architecture: Are We There Yet?, Kim, J., Humbatova, N., Jahangirova, G., Tonella, P. and Yoo, S., Proceedings of the 16th IEEE International Conference on Software Testing, Verification and Validation. [bibtex]

     @inproceedings{Kim2023aa,
     author = {Kim, Jinhan and Humbatova, Nargiz and Jahangirova, Gunel and Tonella, Paolo and Yoo, Shin},
     booktitle = {Proceedings of the 16th IEEE International Conference on Software Testing, Verification and Validation},
     series = {ICST 2023},
     title = {Repairing DNN Architecture: Are We There Yet?},
     year = {2023}
   }