Computational Intelligence for Software Engineering Lab

Latest Publications

1. Evaluating Surprise Adequacy for Deep Learning System Testing, Kim, J., Feldt, R. and Yoo, S., ACM Transactions on Software Engineering and Methodology, 32(2):42:1–29. [bibtex]

     @article{Kim2022hg,
     address = {New York, NY, USA},
     author = {Kim, Jinhan and Feldt, Robert and Yoo, Shin},
     journal = {ACM Transactions on Software Engineering and Methodology},
     month = jun,
     pages = {42:1--29},
     publisher = {Association for Computing Machinery},
     series = {TOSEM},
     title = {Evaluating Surprise Adequacy for Deep Learning System Testing},
     volume = {32(2)},
     year = {2023}
   }
   
   

2. The Inversive Relationship Between Bugs and Patches: An Empirical Study, Kim, J., Park, J. and Yoo, S., Proceedings of the 18th International Workshop on Mutation Analysis. [bibtex]

     @inproceedings{Kim2023pa,
     author = {Kim, Jinhan and Park, Jongchan and Yoo, Shin},
     booktitle = {Proceedings of the 18th International Workshop on Mutation Analysis},
     month = apr,
     series = {MUTATION 2023},
     title = {The Inversive Relationship Between Bugs and Patches: An Empirical Study},
     year = {2023}
   }
   
   

3. Towards Objective-Tailored Genetic Improvement Through Large Language Models, Kang, S. and Yoo, S., Proceedings of the 12th International Workshop on Genetic Improvement. [bibtex]

     @inproceedings{Kang2023lg,
     author = {Kang, Sungmin and Yoo, Shin},
     booktitle = {Proceedings of the 12th International Workshop on Genetic Improvement},
     series = {GI 2023},
     title = {Towards Objective-Tailored Genetic Improvement Through Large Language Models},
     year = {2023}
   }
   
   

4. Arachne: Search Based Repair of Deep Neural Networks, Sohn, J., Kang, S. and Yoo, S., ACM Transactions on Software Engineering Methodology, 32(4):1–26. [pdf] [bibtex]

     @article{Sohn2022cr,
     author = {Sohn, Jeongju and Kang, Sungmin and Yoo, Shin},
     date-modified = {2023-05-29 12:26:00 +0900},
     journal = {{ACM} {T}ransactions on {S}oftware {E}ngineering {M}ethodology},
     number = {4},
     pages = {1--26},
     title = {Arachne: Search Based Repair of Deep Neural Networks},
     volume = {32},
     year = {2023}
   }
   
   

5. A Bayesian Framework for Automated Debugging, Kang, S., Choi, W. and Yoo, S., Proceedings of the 32nd International Symposium on Software Testing and Analysis. [bibtex]

     @inproceedings{Kang2023bb,
     author = {Kang, Sungmin and Choi, Wonkeun and Yoo, Shin},
     booktitle = {Proceedings of the 32nd International Symposium on Software Testing and Analysis},
     series = {ISSTA 2023},
     title = {A Bayesian Framework for Automated Debugging},
     year = {2023}
   }
   
   

6. Repairing DNN Architecture: Are We There Yet?, Kim, J., Humbatova, N., Jahangirova, G., Tonella, P. and Yoo, S., Proceedings of the 16th IEEE International Conference on Software Testing, Verification and Validation. [bibtex]

     @inproceedings{Kim2023aa,
     author = {Kim, Jinhan and Humbatova, Nargiz and Jahangirova, Gunel and Tonella, Paolo and Yoo, Shin},
     booktitle = {Proceedings of the 16th IEEE International Conference on Software Testing, Verification and Validation},
     series = {ICST 2023},
     title = {Repairing DNN Architecture: Are We There Yet?},
     year = {2023}
   }
   
   

7. Large Language Models are Few-shot Testers: Exploring LLM-based General Bug Reproduction, Kang, S., Yoon, J. and Yoo, S., Proceedings of the 45th IEEE/ACM International Conference on Software Engineering. [pdf] [bibtex]

     @inproceedings{Kang2023aa,
     author = {Kang, Sungmin and Yoon, Juyeon and Yoo, Shin},
     booktitle = {Proceedings of the 45th IEEE/ACM International Conference on Software Engineering},
     series = {ICSE 2023},
     title = {Large Language Models are Few-shot Testers: Exploring LLM-based General Bug Reproduction},
     year = {2023}
   }